Multi Holder for 6 Pin Stubs Set The FastScan-C cantilevers utilize a

The FastScan-C cantilevers utilize a novel 40 um long triangular Silicon Nitride cantilever to achieve a 300 kHz resonant frequency with only a 0

The StrataTek™ TEM grids for Transmission Electron Microscopy have a thickness of 25µm and are manufactured using a micron-precision etching process of thin foils

Copper Conductive Tape

Can withstand temperatures up to 300°F (150°C)

Diamond Coated

Multi Holder for 6 Pin Stubs Set The FastScan-C cantilevers utilize aDESCRIPTION SEM Pin Mount Specimen Holders for Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3. 2mm (1 8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain