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CDR140 0.25 N/m This AFM probe is unmounted

SKU: 98791134092

4.8
EUR935.25 EUR955.25

Pay in 4 interest-free payments of $233.81 Learn more

Shipping Estimate
USA
  • USA
  • CAN

Ships within 48 hours · Estimated delivery Aug 13 - Aug 18

Description

This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model RTESPA-300

Max Effective Length = 350 nm

A pack of 10 High quality etched silicon probes for soft TappingMode™ imaging and force modulation in air

enabling imaging of the fragile biological samples without deforming the samples’ fundamental atomic structures

not inlcuded

CDR140 0.25 N/m This AFM probe is unmountedRound Re Entrant Tips for 3 D imaging Max W = 140 nm, Max OH = 30 nm, Max EL = 500 nm DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Round Re Entrant Tips for 3 D imaging Max Width = 140 nm Max Overhang = 30 nm Max Effective Length = 500 nm Tip Geometry: Critical Dimension (Overhang) Tip Height: 10 20 Tip Set Back( RNG): 5 15 Tilt Compensation: cell2 The Aluminum reflective coating on the backside of the cantilever increases the laser signal

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
  • To process your return/exchange, please contact us at [email protected]
  • Please click here for more details>>> Return & Exchange Policy

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