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SCM-PIC-V2 42 N/m Tip Geometry: Critical Dimension (Overhang)

SKU: 91969125319

4.3
USD377.00 USD407.00

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Ships within 48 hours · Estimated delivery Sep 4 - Sep 9

Description

Tip Geometry: Critical Dimension (Overhang) Tip Height: 10 - 20 Tip Set Back( RNG): 5 - 15

Titanium roughness sample for PeakForce QNM

3e-13 EMU (low)

NOTE: Whileformulated for stability

5 Tip Radius (Nom): 25 Tip Radius (Max): 35 Tip Coating: Magnetic Tip Set Back (Nom): 9

SCM-PIC-V2 42 N/m Tip Geometry: Critical Dimension (Overhang)Conductive Probes, 0. 1N m, 10kHz, 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS ***Note: Bruker's new SCM PIC V2 probe replaces the legacy SCM PIC probe. Bruker recommends transitioning to this probe. The legacy SCM PIC is still available for ordering while supplies last, at which point in will become obsolete. Built on the high performance RESP 10 AFM probe, Bruker's SCM PIC V2 probe has a Platinum Iridium coated,electrically

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
  • To process your return/exchange, please contact us at [email protected]
  • Please click here for more details>>> Return & Exchange Policy

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