VITA-MM-NANOTA-200 All The DDLTESP-V2 probe provides:

The DDLTESP-V2 probe provides:

electrically conductive tip that is ideal for Electrical ForceMicroscopy (EFM)

HOPG is often used asa standard testing sample for Scanning Tunneling Microscopy (STM)

overhang) and largevolumeproduction to undercut applications

n-type staircase (SSRM-SMPL-N) and Oxide sample (SSRM-SMPL-OX) also available separately

VITA-MM-NANOTA-200 All The DDLTESP-V2 probe provides:VITA NanoTa, 200um, 0. 5 3. 0N m, 55 80kHz DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS NanoTA probes for MultiMode SPMs, 200 micron length. Note: Requires specialized probe holder model VITA CH MM. If using newerHigh Efficiency probe holder model VITA CH MM HE, then probe model VITA HE NANOTA 200 is required instead. Specifically designed for use with VITA module. Uses other than with VITA module void probe warranty. Probes are micro