Critical Dimension (CD) Calibration Test Specimens for SEM, FIB, and AFM AFM/STM Disks They have near vertical sidewallsand

They have near vertical sidewallsand aspect ratios of more than 10:1

-- Seals cell against cover glass (EC-V2-CO VER GLASS) upon engage

Sharp nitride lever probes ideally suited for Peak Force Quantitative Nano-Electric measurements

Excess resin is removed

This stainless steel probe holder enables electric field gradient imaging for the MultiMode SPM

Critical Dimension (CD) Calibration Test Specimens for SEM, FIB, and AFM AFM/STM Disks They have near vertical sidewallsandDESCRIPTION "Critical Dimension (CD) structures" are particularly useful for SEM FIB magnification calibration and may be used for AFM. Microscopists and engineers using high performance SEMs or FIB systems will find this calibration test specimen useful. The 4. 8 x 4. 8mm silicon standard has a series of patterns with a side length of 480m around its edges, helpful for orientation. There are three versions available. Version with a 10 5 2 1 0. 5um