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ATEC-CONTPt Flat insufficient beam current

SKU: 90021212638

4.0
USD768.70 USD812.70

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Ships within 48 hours · Estimated delivery Sep 3 - Sep 8

Description

insufficient beam current

2mil ACLAR® now available for easier punching

01841 - Carbon Film on 200 mesh

Scanning electron microscopes have a pattern that will show significant differences between backscattered and secondary electron type I and type II images

without peeling off the backing

ATEC-CONTPt Flat insufficient beam currentDESCRIPTION AdvancedTEC Silicon SPM Probe, silicon cantilever for contact mode, detector and tip side: Pt Ir coating

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