SNL-10 FastScan™ EFM Test Sample on 18mm

EFM Test Sample on 18mm Puck for Innova and CP/CP-II

and to automatically make appropriate parameter adjustments

Bruker's new platinum silicide AFM probe is the ideal choice for Scanning Capacitance Microscopy measurements on the most advanced semiconductor features

-- Optimizes Signal-to-Noise ratio for Scanning Capacitance Microscopy with the MultiMode SPM by minimizing stray capacitance

Every aspect of the MPP design has been optimized to provide the most accurate profiling of microscopic features

SNL-10 FastScan™ EFM Test Sample on 18mmSharpened Silicon Tip; 4 Cantilevers 0. 06 0. 35N m; Au Reflective Coating, 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Bruker's Sharp Nitride Lever (SNL) probes are the industry standard for high performance imaging with TappingMode in fluid. These probes marry the sharpness of a Silicon tip with the low spring constant and high sensitivity of a Silicon Nitride cantilever, for an unprecedented level of resolution and force