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5+/-5 Tip Radius (Nom): 20 Tip Coating: Highly conductive single cystal diamond Tip Set Back (Nom): 15-25 Tilt Compensation: 0 +/- 1
Focused Ion Beam (FIB) probes consist of an integrated single crystal TESP silicon cantilever and tip that have been machined (or shaped) toobtain the desired high aspect ratio
Titanium roughness sample for PeakForce QNM
-- REQUIRES one of the second generation Dimension Icon or Edge EC accessories (see model numbers above)
Cantilever Material: Silicon Nitride Cantilever Thickness (Nom): 0
MFMA 150 kHz 5+/-5 Tip Radius (Nom): 20Force Modulation cantilever holder DESCRIPTION TIP SPECIFICATIONS This stainless steel cantilever holder includes a large piezo to drive the tip for low frequency, high amplitude force imaging in air. It can also be used for Tapping and Contact modes. This option includes a force imaging support note and a set of probes. Not compatible with LFM SPMs. This stainless steel cantilever holder includes a large piezo to drive the tip for low frequency, high
