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Ships within 48 hours · Estimated delivery Aug 25 - Aug 30
Usability: The calibrated pattern covers the entire chip
PRODUCT SPECIFICATIONS
677-AFM X-Y Cross Line Grating Replica
Scanning electron microscopes have a pattern that will show significant differences between backscattered and secondary electron type I and type II images
PELCO® Pinpointer Grids
2000 lines/mm Cross Line Grating Replica Tweezers Usability: The calibrated pattern coversDESCRIPTION 677 AFM X Y Cross Line Grating Replica, 2000 lines mm, Cellulose Acetate, mounted on 12mm AFM STM Specimen Disc 677 AFM 10 X Y Cross Line Grating Replica, 2000 lines mm, Cellulose Acetate, mounted on 10mm AFM STM Specimen Disc 677 STM X Y Cross Line Grating Replica, 2000 lines mm, Carbon Au Pd Coated, mounted on 12mm AFM STM Specimen Disc 2,000 lines mm cross line grating replica is suitable for X Y calibration. The replicas have well
US$ 10.56
US$ 23.34
US$ 31.98
US$ 10.00
