PELCO Small FIB Grid Holder Select:Replacement Brass Screws KIT CONTENTS

KIT CONTENTS

Cryogenic stability: may be used as low as -270°C (518°F)

The TG3D-3000/600 test grating with its 3-Dimensional array is intended for lateral calibration of SPM scanners

It has more facets or cutting edges and keeps its cutting ability by being less friable (easily crumbled or pulverized) than the more common and less costly monocrystalline diamonds

NM-SS with soft plastic grips

PELCO Small FIB Grid Holder Select:Replacement Brass Screws KIT CONTENTSDESCRIPTION SEM Pin Mount Specimen Holders for Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3. 2mm (1 8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain