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making them easier to use and providing a much better seal than the previous circular cross-section rings
000x Pitch Standard for Scanning Electron Microscopy
holes and slots
This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model TESP-V2
Green circle showing a single lattice defect
TEM Grid Holder on 12.2mm Stub 150 kHz making them easier to useDESCRIPTION This TEM grid holder holds up to 4 TEM grids. It enables imaging and analyzing specimens on TEM grids in the SEM. For EDS applications it is beneficial to place thin films on a TEM grid or small particles on a TEM grid with a support film. This can significantly reduce background in the EDS spectrum and increase detection limits of the EDS detector. Hole size in the top and base is 2. 1mm. Opening angle on the holes in the top and base is
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