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For use only in secondary or backscattered electron mode
Useful for chemical processing
Cantilever Holder for Scanning Capacitance Microscopy with the MultiMode SPM
Width x Thickness 5618 DUMOSTAR High Precision
Made on a G400
AR5-NCLR 6 For use only in secondaryDESCRIPTION HIGH ASPECT RATIO Probe, silicon cantilever for non contact tapping mode, long cantilever, HIGH ASPECT RATIO tip, aspect ratio 5: 1, detector side: Al coating
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