FESP-V2 Silicon The Bruker SCM-PtSi probe provides:

The Bruker SCM-PtSi probe provides:

loss of force control

depending on contact radius measured on a silver surface

This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model TESP-V2

31 Cantilever Thickness (RNG): 0

FESP-V2 Silicon The Bruker SCM-PtSi probe provides:2. 8N m, 75kHz, 4 Sided Tip, No Coatings, 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of 10 High quality etched silicon probes for soft TappingMode imaging and force modulation in air. Unmounted for use on standard AFM's. Bruker AFM Probes has introduced an improved version of its popular,FESP FESPA AFM probes. Brukers new line of FESP high quality premiumetched silicon probes set the industry standard for soft TappingMode