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Low Magnification Calibration Ruler 0.2 N/m Tapping Mode AFM Probe

SKU: 82575519594

4.1
USD171.70 USD218.70

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Ships within 48 hours · Estimated delivery Sep 1 - Sep 6

Description

Tapping Mode AFM Probe

Specifications of the silicon substrate used: prime virgin silicon wafer

4 each 80nm

adhesive is 0

and development of precisionmetrology methods

Low Magnification Calibration Ruler 0.2 N/m Tapping Mode AFM ProbeDESCRIPTION 100 markings, divisions 0. 01mm on disc Calibration ruler on 1 8" (3. 2mm) nickel plated copper disc. 1mm long scale with 100 markings, with 0. 01mm divisions with an accuracy of + 0. 0005mm or better. Available unmounted, or mounted on SEM mounts. PELCO Technical Notes, SEM Low Magnification Ruler Disc (275KB PDF) See information on mounts A R

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
  • To process your return/exchange, please contact us at [email protected]
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