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Sample to demonstrate imaging work function differences for KPFM
3 MESP-LM-V2 probes
12mm Mounted DESCRIPTION
Chromium adhesion layer thickness: 5nm
MFM starter kit for MultiMode SPM DESCRIPTION
145nm Pitch Calibration Standard for AFM 50 kHz Sample to demonstrate imaging workDESCRIPTION 145nm AFM Reference Standard, Certified, Non traceable, Mounted on disk: 145nm Very High Resolution AFM Reference Standard on 12mm steel disk 145nm AFM Reference Standard, Certified, Non traceable, Unmounted: 145nm Very High Resolution AFM Reference Standard, Unmounted Precision holographic pattern for accurate calibration for high resolution, nanometer scale measurements. Period: 145nm pitch nominal, one dimensional array. Accuracy is +
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