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The fabrication process guarantees excellent uniformity of the structures across the chip
602-02Q - PELCO X-Checker® B: Mn
Use for straightening
2mm) pin on JEOL SEMs (including JEOL NEOSCOPE)
G600HH: Pitch 37µm
PR-EX-TnIR-D-10 PELCO® Pro Mini The fabrication process guarantees excellentDESCRIPTION SPECIFICATIONS A 10 pack of probes for tapping mode imaging and nanoIR spectroscopic measurements. Pre mounted on half washer mounts (link 1560 00) specifically for use in Brukers nanoIR platform. This 300khz tapping mode probe has a full wrap gold coating, on the reflex side for increased feedback laser signal, on the tip side to enable nanoIR measurements. General Specifications Property Nominal Value Minimum Maximum Tip Radius (nm) 20.
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