RS 5 kHz Kelvin Probe Force Microscopy (KPFM)

Kelvin Probe Force Microscopy (KPFM)

Precision-etched Tungsten wire for STM mode

or Torsional Resonance mode

Unmounted Oxide sample

Polycarbonate (PC)

RS 5 kHz Kelvin Probe Force Microscopy (KPFM)Titanium roughness sample DESCRIPTION CANTILEVER SPECIFICATIONS Titanium Roughness Sample. This is used with the NanoScope tip evaluation software. Tip evaluation software provides on command "worst case" probe shape diagnosis based on scanning of this roughness sample. Includes one sample coated with polycrystalline titanium. Die is 8. 5mm x 8. 5mm square and is unmounted. This is for use with the NanoScope tip evaluation software. Tipevaluation