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Non-Magnetic Sample Holder for CP-II DESCRIPTION
Theseprobes also have a tip radius (< 20 nm) which is difficult toroutinely obtain by standard AFM probe processing methods
center-marked
16 N/m nominal
***Note: Bruker's new MESP-V2 probe replaces the legacy MESP probe
SiC-STEP Calibration Samples 300 Mesh Non-Magnetic Sample Holder for CP-IIDESCRIPTION 6H SiC (0001) based calibration sample which is designed to perform easy calibrations of an AFM scanner's vertical movements in several nanometers interval. The simplicity of calibration of the calibration process is provided by the nearly uniform distribution of half monolayer high steps (either 0. 75 or 1. 5nm) on the sample surface demonstrating both chemical and mechanical stability. The step height corresponds to the half of the
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