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Made of strong reinforced plastic
2mm (5-7/8")
16216 - Specimen Mount
Bar Width 33µm
56-75 - Highest Grade V1 Mica
PELCO® NiOx Test Specimen for Analytical Electron Microscopy (AEM) Soft Tapping Mode Made of strong reinforced plasticDESCRIPTION inexpensive characterization of instrument performance The NiOx Test Specimen has been developed for advanced analytical TEM's equipped with X Ray Micro Analysis Systems (EDX) and or Electron Energy Loss Spectrometers (EELS) to characterize instrument performance. It consists of a 55nm layer of NiOx on a 25nm carbon support film on a 200 mesh Mo TEM grid. The NiOx Test Specimen is valuable in at least three ways: When evaluating TEM's and
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