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Ships within 48 hours · Estimated delivery Aug 18 - Aug 23
Standard Mesh
08mm 5322 DUMONT Electronic
Convenient for holding flat or thin specimens such as Si chips
Bruker's Value Line of soft TappingMode™ and Force Modulation probes
1mm 5074 PELCO® ESD Safe Ergo Tweezers
Tap190GB-G GILDER Grids Standard MeshGold Coated Tapping Mode AFM Probe with Long Cantilever DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Gold Coated Tapping Mode AFM Probe with Long Cantilever Monolithic silicon AFM probe for high frequency non contact and tapping mode operation. The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility. The AFM holder chip fits most commercial AFM
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