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Kelvin Probe Force Microscopy (KPFM)
Gold Coated Microscope Slide and Coverslips
91mm) with a range of 0
End radii are controlled to 30nm +/- 15%
3-Sided pyramidal diamond probe
APSH-0040 CPII Kelvin Probe Force Microscopy (KPFM)Cross Sectional Sample Holder DESCRIPTION The Cross Sectional Sample Holder, 0. 75" in diameter and 0. 26" tall, is used when the cross sectional surface of a sample is to be scanned. The cross sectional sample holder is included in the Scanning Capacitance Microscopy (SCM) option for Innova and CP II (Model PSSC 0100), but it is useful for Caliber and Dimension SPMs.
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