Ø32mm x 6mm pin height; shorter pin for all Zeiss/LEO SEM, FESEM & FIB systems Unit:pkg/100 Scanning probe microscopes have a

Name: Ø32mm x 6mm pin height; shorter pin for all Zeiss/LEO SEM, FESEM & FIB systems Unit:pkg/100 Scanning probe microscopes have a
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SKU: 63179226466
Price: 56.25 USD
Availability: InStock
Rating: 4.3132 (23 reviews)

SKU: 63179226466

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Description

Scanning probe microscopes have a pattern that is closely sized to the finest cantilever tips challenging their resolution ability

16508-P -Highly Polished Carbon Planchets

Linearity Testing: With a 1µm² pitch over 40 x 40µm

slightly rotating tab when lifting

Small feature sizes do not obscure sample features

Ø32mm x 6mm pin height; shorter pin for all Zeiss/LEO SEM, FESEM & FIB systems Unit:pkg/100 Scanning probe microscopes have aDESCRIPTION 32mm x 6mm pin height; shorter pin for all Zeiss LEO SEM, FESEM & FIB systems ZEISS LEO SEM, FESEM & FIB systems, aluminum, grooved edge, 32mm

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