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#614-6 – OM/R which is the 44
Surface structure: Titanium lines on Silicon
two rubber shrouds and one cantilever mounting fixture
Pre-mounted on half washer mounts for easy exchange in the AFM head
Pitch: 125 microns
SEM Magnification Standard and Stage Micrometer MRS-4 - Retainer for MRS-4 DEKTAK XTL #614-6 – OM/R which isDESCRIPTION Protective Retainer for MRS 3 4, SEM, 1" x 0. 125" (25. 4 x 3. 18mm) with clear hole for transmission measurements. Standard recessed 0. 02" (0. 5mm) The 10x to 200,000x standard for Scanning Electron Microscopy with 1 2, 1, 2, 50 and 500m pitch patterns and X & Y Micro ruler Selected MRS 4 Patterns in Greater Detail Applications Electron microscopy SEM, in both SE and BSE mode, SEM FIB and TEM (with special version) Scanning Microscopies
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