SEM Magnification Standard and Stage Micrometer MRS-4 - Specimen Mounts 80 N/m These tips are formed from

These tips are formed from tungsten wire

Very strong and rugged clear polycarbonate box to store stainless steel AFM discs with 6

Although not necessary for general imaging

4" wafer precut into 20 x 30mm chips approximately 6 chips/wafer

PELCO® Tabbed Hole Grids

SEM Magnification Standard and Stage Micrometer MRS-4 - Specimen Mounts 80 N/m These tips are formed fromDESCRIPTION Mounting MRS 3 4 Retainer on 1" (25. 4mm) Pin Stub with a 1 8" (3. 2mm) pin, for #614 5 only Mounting MRS 3 4 Retainer on Hitachi 25x10mmxM4 Cylinder Mount, for #614 5 only The 10x to 200,000x standard for Scanning Electron Microscopy with 1 2, 1, 2, 50 and 500m pitch patterns and X & Y Micro ruler Selected MRS 4 Patterns in Greater Detail Applications Electron microscopy SEM, in both SE and BSE mode, SEM FIB and TEM (with special version)