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Bruker's Value Line of soft TappingMode™ and Force Modulation probes
Conductive with a contact resistance in the 100kOhm range
5 ± 2 Tip Radius (Nom): 8 Tip Radius (Max): 12 Tip Set Back (Nom): 9
-- Included in the new MM-SCM-V3 Scanning Capacitance Microscopy solution for MultiMode
The Aluminum reflective coating on the backside of the cantilever increases the laser signal (A+B) by up to 2
NM-TC Adama Innovations Bruker's Value Line of softDESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Nanomechanics Probe, 350 N m, 750kHz, 25nm ROC, 5 Pack. Uncalibrated. These tips are specifically designed for high mechanical loads and scratch testing applications. By using wear resistant diamond and a broad cone angle the contact size is well characterized and stays constant during repeated mechanical measurements. These probes have demonstrated highly repeatable deep (~100nm) indentations
