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Z plane measurements are traceable to a NIST standard only
Also used as a low melting point (100° C) wax for sample mounting applications
The tweezers tips are shaped and aligned to pick up less moisture when removing grids from a liquid
Gold Plated
Width x Thickness 5367-12DLC PELCO® Pro High Precision
PELCO® Single 1/2" FIB Sample and Grid Holder Select:Replacement Brass Screws Z plane measurements are traceableDESCRIPTION SEM Pin Mount Specimen Holders for Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3. 2mm (1 8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain
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