RMN-25PT300B Adama Innovations Calibration artifact: grating for CP

Calibration artifact: grating for CP & CP-II DESCRIPTION

Tip Geometry: Rotated Tip Height: 3 - 8 Front Angle: 15 Back Angle: 1 - 24 Tip Radius (Nom): 1 Tip Radius (Max): 2 Tip Set Back (Nom): 3 Tip Set Back( RNG): 0-5

Cantilever Material: Silicon Cantilever Thickness (Nom): 2 Cantilever Geometry: Rectangular Cantilevers Number: 1

This is a normal occurrence and does not influence performance of the specimen

This Non-Magnetic Cantilever Holder supports contact AFM and TappingMode operation in air on the Dimension/Bioscope SPM heads

RMN-25PT300B Adama Innovations Calibration artifact: grating for CPMETAL PROBE, 300UM, 18N M, 20KHZ DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Solid Metal Probe, 18 N m, 20 kHz RockyMountain Nanotechnology (RMN) probes are uniquely constructed from pureplatinum and placed on a standard AFM probe sized ceramic substrate. Solid metal probes offer excellent conductivity and suffer no thin filmadhesion problems that occur with metal coated silicon probes. Theseprobes also have a tip radius (< 20 nm) which