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292nm Pitch High Magnification, High Resolution Calibration Standard for SEM, Auger and FIB PELCO® Special Metal Grids AFM: use in contact

SKU: 53292686236

4.6
USD1293.92 USD1341.92

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Ships within 48 hours · Estimated delivery Aug 17 - Aug 22

Description

AFM: use in contact

cross-section cannot be taller than the height supported by the microscope

For a sharper ScanAsyst tip for fluid imaging please use the ScanAsyst-Fluid+

Packaging: 100 grids per vial/tube

5mm square and is unmounted

292nm Pitch High Magnification, High Resolution Calibration Standard for SEM, Auger and FIB PELCO® Special Metal Grids AFM: use in contactDESCRIPTION Precision holographic grating standard with high contrast and excellent edge definition. Period: 292nm pitch nominal, one dimensional array. Accuracy is + 1%. Calibration certificate will give the actual pitch of the standard. Surface structure: Titanium lines on Silicon, 4x3mm dimensions. Line height (about 30nm) and line width (130nm) are not calibrated. Usability: The calibrated pattern covers the entire chip. There is sufficient usable

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
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