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and other electrical characterization applications
Other applications of the DDESP-FM-V2 probe include: Scanning Capacitance Microscopy (SCM)
Bruker's new platinum silicide AFM probe is the ideal choice for Scanning Capacitance Microscopy measurements on the most advanced semiconductor features
265 Cantilever Geometry: Special Cantilevers Number: 1 Back Side Coating: Reflective Au
Built on the high-performance RFESP-75 AFM probe
AD-2.8-AS 22 kHz and other electrical characterization applicationsSharp Conductive Single Crystal Diamond Probes, 2. 8 N m, 65 kHz, 10 nm ROC, 5 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Sharp Conductive Single Crystal Diamond Probes, 2. 8 N m, 65 kHz, 10 nm ROC, 5 Pack Intermediate spring constant for applications including: Topography imaging in PeakForce Tapping, Tappingmode, and contact mode. Nanomechanics with PeakForce QNM, FASTForce Volume, contact resonance, nanoindentation. Highly
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US$ 77.00
