Wider Version Large Set Screw Vise SEM Stage Adapters GA2000: 50µm

GA2000: 50µm

and afm+ for CAFM measurements and contact mode imaging

00 silicon cantilever for non-contact- / tapping-mode

The simplicity of application and smooth

and you can start

Wider Version Large Set Screw Vise SEM Stage Adapters GA2000: 50µmDESCRIPTION SEM Pin Mount Specimen Holdersfor Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3. 2mm (1 8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain