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AFM users with Bruker's latest electrical characterization techniquesbased upon PeakForce Tapping technology should consider using PFTUNA or PFQNE-AL probes
3 MESP-LM-V2 probes
The modulus of this sample and its variation over time are only approximately known
100nm Wide Spike @ 1µm
nanoscratching
00-107-0142 Thermal AFM users with Bruker's latestChip carrier with lead for unmounted cantilever, CP II DESCRIPTION Chip carrier with lead, CPII Innova; The unmounted probe chip carrier with lead provides mounting of unmounted probes on a metallic adaptor that interfaces to the CPII Innova probe cartridge. The wire connected to the chip carrier allows the tip bias to use external volatege sources. This part is included in the Electrostatic Force Microscopy (EFM) Option.
US$ 515.00
US$ 13.00
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