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CP - PEEK (polyether ether ketone) reinforced with carbon fiber
Gold Coated Microscope Slide and Coverslips
Surface structure: Titanium lines on Silicon
Tilt-Compensated High Aspect Ratio (5:1) Focused Ion Beam (FIB) probes for high resolution TappingMode imaging on samples with tall/deep geometries
Athene Thin Bar Grids
DUMONT High Precision Grade Tweezers 1 AFM Test Grating CP - PEEK (polyether etherDESCRIPTION SS, NM SS, PTFE coated SS, CS. Available in 16 styles and many finishes. Suitable for most general laboratory use. SS= stainless steel, NM SS= non magnetic stainless steel DUMONT High Precision Tweezers for electron microscopy, electronics, forensics, histology, and general laboratory use. Includes fine pointed, strong, PTFE coated, slim, short and cutting tweezers. Prod # Description Style Length Metal Points Width x Thickness 5116
