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254 – 301µm
SEM holders and specimen preparation equipment
16327-10 - PELCO SEMClip™
This may be due to inferior resolution at low voltage or poor signal to noise ratio when operating at high scanning rates with small spot sizes
This thin film coating shows a granular
ElectriTap190-G Select Quantity:50 per set 254 – 301µmElectrical, Tapping Mode AFM Probe with Long Cantilever DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Electrical, Tapping Mode AFM Probe with Long Cantilever Monolithic silicon AFM probe for high frequency non contact and tapping mode operation, and electric modes such as: scanning capacitance microscopy (SCM) electrostatic force microscopy (EFM) Kelvin probe force microscopy (KFM) scanning probe lithography The rotated tip allows for more
