Pay in 4 interest-free payments of $226.56 Learn more
Ships within 48 hours · Estimated delivery Aug 2 - Aug 7
55 Cantilever Geometry: Rectangular Cantilevers Number: 1
These SPM Calibration Gratings are designed specifically for three dimensional monitoring and calibration of scanning probe microscopes
Highly sensitive nanoelectrical measurements
The FastScan-C cantilevers utilize a novel 40 um long triangular Silicon Nitride cantilever to achieve a 300 kHz resonant frequency with only a 0
25 N/m spring constant for reliable highest resolution imaging on any sample
FIB6-400A 110 kHz 55 Cantilever Geometry: Rectangular Cantilevers42N m, 320kHz, 10nm Tip Radius, 400nm Wide Spike @ 6m, Al reflective coating DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS 42N m, 320kHz, 10nm Tip Radius, 400nm Wide Spike @ 6m, Al reflective coating High aspect ratio probe based upon Bruker technology and made from our TESP. Aspect ratio of 15: 1 at 6um from tip apex. Tip Geometry: High Aspect Ratio Tip Height: 10 15 Front Angle: 1. 7 Back Angle: 11 31 Side Angle: 1. 7 Tip Radius (Nom): 10
