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Bruker's Value Line of soft TappingMode™ and Force Modulation probes
NanoTA probes for Dimension SPMs
Bruker's new platinum silicide AFM probe is the ideal choice for Scanning Capacitance Microscopy measurements on the most advanced semiconductor features
This cost-effective probe has a nominal tip radius of 35 nm for excellent lateral resolution for MFM
Requires specialized probe holder model VITA-CH-IN when used withInnova/Caliber AFMs
SCANASYST-AIR-HR Vx & UVx Bruker's Value Line of softSharpened, 1 lever, 0. 4N m, Al Reflex coating DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS ScanAsyst Air HR probes are specifically designed for use with the ScanAsyst HR fast scanning accessory on the MultiMode 8 AFM. Enjoy up to 20X faster survey scan rates and up to 6X faster scans with no loss of resolution. This remarkable development leverages Brukers exclusive ScanAsyst Self Optimizing Atomic Force Microscopy Imaging Mode, which
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