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Cross-Sectional Sample Holder DESCRIPTION
Period: 144nm pitch
100-200 mesh
Complete with clear polystyrene lid and clear polypropylene clip
50NM W FULL CARBON CD PROBE
FASTSCAN-A SEM Specimen Substrates Cross-Sectional Sample Holder DESCRIPTIONFastScan Probes, 1,400kHz, 17N m, Al Reflex Coating, 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS FastScan A probes are designed specifically for imaging in air on the Dimension FastScan AFM. They deliver extreme imaging speed without loss of resolution, loss of force control, or added complexity. With the ability to perform 20x to 100x faster scans, these probes provide users with more high quality data at a considerably faster
