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RTESPA-525 10 nm Max OH = 30 nm

SKU: 40255621899

4.7
USD293.08 USD339.08

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Ships within 48 hours · Estimated delivery Aug 31 - Sep 5

Description

Max OH = 30 nm

5um Cantilever Thickness (RNG): 1-2um Cantilever Geometry: Rectangular Cantilevers Number: 1 Back Side Coating: Reflective Au

Fluid Cantilver Holder Splash Guards for Closed-Loop Heads DESCRIPTION

This is used with the NanoScope tip-evaluation software

Built on the high-performance RFESP-75 AFM probe

RTESPA-525 10 nm Max OH = 30 nm200N m, 525kHz, Symmetric Tip, Al Reflex Coating, 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of 10 High quality etched silicon probes for hard TappingMode and other non contact modes. Unmounted for use on standard AFM's. Bruker's flagship MPP probes are the preferred choice for high sensitivity silicon probe imaging in TappingMode or non contact mode in air. Every aspect of the MPP design has been optimized to provide the

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
  • To process your return/exchange, please contact us at [email protected]
  • Please click here for more details>>> Return & Exchange Policy

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