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SCM cantilever holder for Dimension series SPMs DESCRIPTION
(We recommend the use of a “D-type” 3-ring binder for best results)
the hole and bar widths are shown
Transmission 74%
MEM Grid Storage Box for 32 grids / 8 blocks
Triangular Test Grating for X- or Y-axis Select:Test grating TGT-1500, 3µm pitch, unmounted SCM cantilever holder for DimensionDESCRIPTION The TGT 1500 test grating is intended for SPM calibration in X or Y axis, determination of lateral and vertical scanner nonlinearity, detection of angular distortion and tip characterization. Nominal values for height and pitch are given below. Actual values come with the test grating. Structure: Si wafer with grating in top surface Pattern type: 1 D array of triangular steps with precise linear and angular dimensions Edge angle:
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