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Samples on 12mm discs DESCRIPTION
MFM Probes
The Silicon tip has an extremely sharp 5 nm tip radius
5 Tip Set Back( RNG): 0 - 7
75 Cantilever Geometry: Rectangular Cantilevers Number: 1 Back Side Coating: Reflective Aluminum
NC-LC 100 N/m Samples on 12mm discs DESCRIPTIONDESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS High wear resistant diamond cone probe with high probe to probe consistency in tip shape and a tip radius of 20nm. Ideally suited to long lifetime imaging on low relief samples at moderately high resolution. Conductive with a contact resistance in the 100kOhm range. Intermediate spring constant of 8N m. For even higher resolution consider the AD series of diamond probes. Applications include
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