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Ships within 48 hours · Estimated delivery Aug 16 - Aug 21
Cantilever & wafer tool kit: 1 scribe
This holder supports Electrostatic Force Microscopy (EFM)
"Three-dimensional architecture of inorganic nanoarrays electrodeposited though a surface-layer protein mask"
Supplied with M4 screw
Hard and strong (hardness = 230 HV1)
Tipcheck AFM Tip Characterizer PELCO® Grids Cantilever & wafer tool kit:Sample for Analyzing AFM Tip Geometry DESCRIPTION Sample for Analyzing AFM Tip Geometry The problem: Blunt or broken tips falsify measurement results like surface roughness or structures dimensions dramatically! To ensure correct results, used tips must be thrown away or checked by SEM regularly, both methods being extremely uneconomic or time consuming. The solution: The TipCheck is an SPM sample for fast and convenient determination of the AFM tip
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