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Ships within 48 hours · Estimated delivery Aug 1 - Aug 6
high electrical and thermal conductivity and high temperature operation properties
The final thickness of the foil is about 20nm
Shape Beam Force Constant 0
Replacement Tips 242 Carbofib 1
From 10µm To 20µm Tip Radius < 10nm Half Cone Angle 20°-25° along cantilever axis
Pelcotec™ CDMS-XY-0.1T 8 nm high electrical and thermal conductivityDESCRIPTION PRODUCT SPECIFICATIONS NIST traceable* with features from 2mm to 100nm for magnification 10 200,000x for SE, FESEM and FIB *Uses average data measured for each production wafer. Feature sizes: 2mm, 1mm, 0. 5mm, 0. 1mm, 50m, 10m, 5m, 2m, and 1m, 500nm, 250nm and 100nm See mount selections, types A R Pelcotec CDMS XY Critical Dimension Magnification Standard Available as NIST Traceable or as Certified against NIST Standard Easy to use and
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