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Both coatings are available on 50nm and 200nm PELCO® Silicon Nitride Membranes with a 0
accurately cut for square edges
base and two locking nuts
This tape is used for printed circuit board masking during electroplating
Scanning electron microscope (SEM and Focussed Ion Beam (FIB) system resolution is defined in terms of a combination of criteria: resolution and number of gray levels in the image
All-In-One-DLC Select Quantity:10 per set Both coatings are available onDiamond Like Carbon Coated AFM Probe with 4 Different Cantilevers for Various Applications DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Diamond Like Carbon Coated AFM Probe with 4 Different Cantilevers for Various Applications Versatile silicon AFM probe with 4 different cantilevers on a single AFM holder chip. Rotated, monolithic silicon AFM probe with symmetric tip shape for various applications (contact mode, force modulation mode,
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