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It is more electron transparent with small feature sizes
Scale lines are provided in both X and Y axes for ease of 2 axis calibration without stage rotation
Value Line Silicon Nitride probe for contact mode imaging and force measurements on soft samples
finger control pen
fully compatible with standard TEM holders (no broken edges)
CS-20NG 100mm It is more electron transparentXYZ Calibration Nanogrid; Arrays with Down to 500nm Pitch; 20nm Height DESCRIPTION XYZ Calibration Nanogrid; Arrays with Down to 500nm Pitch; 20nm Height Why XYZ Calibration Nanogrid? In order to make the most of their measurement capabilities, AFM systems need to be properly calibrated. The more accurate your calibration standard, the more accurate AFM measurement results can be achieved. In this respect, nanogrid calibration standards allow the most
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