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DualBeam® or CrossBeam® instruments for subsequent TEM imaging
Micro Vise Holder
at high scan rates for AFM dynamics observations
15370 - T-Base Adapter for Hitachi
Feature Value Tip Height (µm) 12
qp-SCONT AFM probes per pack:50 DualBeam® or CrossBeam® instruments forDESCRIPTION uniqprobe, uniform quality SPM probe for soft contact mode, detector side: partial Au coating
US$ 19.00
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