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DualBeam® or CrossBeam® instruments for subsequent TEM imaging
Micro Vise Holder
at high scan rates for AFM dynamics observations
15370 - T-Base Adapter for Hitachi
Feature Value Tip Height (µm) 12
qp-SCONT AFM probes per pack:50 DualBeam® or CrossBeam® instruments forDESCRIPTION uniqprobe, uniform quality SPM probe for soft contact mode, detector side: partial Au coating
US$ 64.80
US$ 64.80
US$ 175.57
US$ 79.20
US$ 126.40
US$ 96.05
US$ 87.55
US$ 96.05
US$ 96.05
US$ 83.30
US$ 180.00
US$ 188.00
US$ 78.30
US$ 64.80
US$ 83.00
