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#5367-11NM
5nm atomic layer-deposited alumina and fluoro-methyl-silane on 15
Specimen holder for 1" or 25mm metallographic mounts
Bruker's SCM-PIC-V2 probe has a Platinum-Iridium coated
Tescan (also for Philips
PELCO X-CHECKER™ Select:K-Mount #5367-11NMDESCRIPTION Monitor Energy Dispersive Spectrometer SEM Systems The updated PELCO X Checker is a calibration aid to help you monitor the performance of your EDS X ray system on an SEM. The PELCO X Checker contains a series of standard materials on your choice of aluminum mount. With PELCO X Checker, you can check your detector resolution and calibration, test for contamination on the detector window, monitor low end sensitivity, and calibrate your
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