VGRP-UM Unmounted Instrument This is used with the

This is used with the NanoScope tip-evaluation software

Au coated tips

They deliver extreme imaging speed without loss of resolution

Observation of rugged samples:The tip is thin with the tip angle of 35 degrees

Tipless cantilevers for Contact Mode or Fluid TappingMode imaging and force measurement with a variety of extremely low spring constants for high force sensitivity

VGRP-UM Unmounted Instrument This is used with theCalibration artifact: 180nm step height, 10m pitch DESCRIPTION Calibration artifact, 180nm step height, 10m pitch. This Bruker SurfaceTopography Reference Dies have a variety of step heights and pitches fordaily monitoring of SPM performance. The silicon die with patternedlayer of SiO2 is coated with Pt. All die are 8mm x 8mm and unmounted. They are not certified or traceable to NIST. Replaces model STR10 1800P.