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electrically conductive tip that is ideal for Electrical Force Microscopy (EFM)
-- Included with the second generation Dimension Icon and Edge EC accessories (Models ICONEC-V2-NOPOT
and 60mm Petri dishes
electrically conductive tip that is ideal for various electrical characterization applications
Max Overhang = 30 nm
VITA-TS-STHM 6 N/m electrically conductive tip that isVITA Scanning Thermal Microscopy, SThM, test sample DESCRIPTION VITA Scanning Thermal Microscopy, SThM, test sample. Allows user to become familair with SThM technique on Veeco SPM.
US$ 160.00
US$ 160.00
US$ 160.00
