CLST-PTBO 3-degree Automated AFM (InSight 3DAFM and "C" and "D" cantilevers

and "C" and "D" cantilevers on the other side of the probe

Microfabricated silicon probes that are ~450 microns long and are coated with ~25 nm of PtIr conductive coating on both sides of the cantilever

these probes provide consistent results over many dozens of images

Sensitive nanoelectrical measurements with highly conductive coating

5N/m nominal

CLST-PTBO 3-degree Automated AFM (InSight 3DAFM and "C" and "D" cantilevers20mm cut Platinum Iridium, 0. 50mm diameter DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of STM Probes Precision cut Platinum Iridium wire for Scanning Tunneling Microscopy. Unmounted for CPII Innova AFMs. Quantity=10 These tips are formed from platinum iridium wire and cut at the end to form the tip. The wire is 0. 5mm in diameter and is recommended for Veeco's Innova and CP II SPMs. Tip Geometry: Solid Wire Cantilever Geometry: