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5 Tip Radius (Nom): 10 Tip Radius (Max): 40 Tip Set Back (Nom): 4 Tip Set Back( RNG): 0 - 7
55 Cantilever Geometry: Rectangular Cantilevers Number: 1 Front Side Coating: Magnetic CoCr Back Side Coating: Reflective CoCr
Bruker's new platinum silicide AFM probe is the ideal choice for Scanning Capacitance Microscopy measurements on the most advanced semiconductor features
4-Sided Tip
SThM probes for Dimension SPMs
SPRING-L <100 nm 5 Tip Radius (Nom): 10Replacement scanner springs for AS 130 and AS 200 type scanners DESCRIPTION TIP SPECIFICATIONS Replacement scanner springs for AS 130 and AS 200 type scanners, MultiMode SPM. These springs supply tension to the AFM optical head, scanner, and base for mechanical stability. These springs supply tension to the AFM optical head, scanner, and base for mechanical stability.
