JN-1 SEM Demonstration Specimens Strong Magnetic Force Microscopy (MFM)

Magnetic Force Microscopy (MFM)

Bruker's new line of MLCT-BIO high-quality

Storage Box and Holder for 14 of 12

Gilder Standard Square Mesh - overall thickness variation: G50: 25µm

Solid metal probes offer excellent conductivity and suffer no thin-filmadhesion problems that occur with metal-coated silicon probes

JN-1 SEM Demonstration Specimens Strong Magnetic Force Microscopy (MFM)DESCRIPTION SAMPLE IMAGES The JN 1 Scanning Electron Microscope Demonstration Standard Specimen demonstration samples on two standard 12. 7mm (1 2") pin stubs and a 25mm mounting adapter. They allow for demonstrating any SEM at lower magnifications with known specimens. The variety of demonstration samples can also be used for training purposes. They are ideal for use on table top SEMs such as the JEOL NeoScope, Hitachi TM 1000 3000 3030, Phenom and